|
|
JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY
HYDERABAD
IV. B.Tech. MMT I-Sem T P C
4+1* 0 4
X-RAY METALLOGRAPHY
UNIT -I
Introduction - Production and properties of x-rays. Stereographic projection Bragg’s law of diffraction. Diffraction directions and diffraction methods.
UNIT - II
Intensity of Diffracted beams - Scattering by an electron by an atom, by a unit cell, structure-factor calculations: factors to be considered in calculating the intensities.
UNIT - III
Experimental Methods - Laue Photographs: Powder photographic methods, Debye- Scherrer methods, focussing cameras, pinhole photographs: Diffractometer measurements.
UNIT - IV
Applications - Orientation of single crystals, Laue method, Diffractometer method, effect of plastic deformation, the structure of polycrystalline Aggregates, crystal size crystal perfection, crystal orientations:
UNIT-V
Determination of crystal structure, precise lattice parameter measurements.
UNIT - VI
Applications - phase - diagram determination.
UNIT-VII
Order-disorder transformation: chemical analysis by Diffraction.
UNIT-VIII
Qualitative analysis, quantitative analysis, stress measurement.
|
| Author: India 22 Dec 2007 | Member Level: Diamond Points : 2 |
TEXT BOOK:
1. Elements of X-ray diffraction by BD Cullity
REFERENCES:
1. Structure of Metals - GS Barrett and TB Masallski. 2nd Edition.
2. X-ray diffraction methods - EW Nuffield.
|